A pEek on the lab

The Microanalytical center of the Jožef Stefan Institute is a laboratory devoted to the application and development of experimental techniques based on accelerated ion beams. The laboratory is equipped with 2MV Tandem ion accelerator and three different ion sources providing variety of ion beams in the energy range of few 100 keV up to 12 MeV. Accelerated ions are guided into 4 beamlines hosting dedicated end stations. The facility is operating a state-of-the art microbeam setup fed by a high-brightness Multicusp ion source providing high intensity focused proton beams in the submicron range. We are constantly upgrading the beamlines and experimental end stations to keep the laboratory at the forefront of European ion-beam centers.

A complete in-vacuum curved-crystal x-ray emission spectrometer in Johansson geometry (http://dx.doi.org/10.1063/1.3697862/) is used to perform XES measurements in the 2-6 keV energy range with sub natural line-width energy resolution. The spectrometer is designed to measure x-ray emission induced by photon and charged particle impact on solid and gaseous targets. It works with a relatively large x-ray source placed inside the Rowland circle and employs position sensitive detection of diffracted x-rays. Its compact modular design enables fast and easy installation at a synchrotron or particle accelerator beamline. The spectrometer is used to perform electronic structure studies of complex bulk materials.