A pEek on the lab
czech metrology institute (Czech Republic)
LAB and RESEARCH
CZECH METROLOGY INSTITUTE
The Czech Metrology Institute (CMI) is the National Metrology Institute of the Czech Republic. CMI provides uniformity and precision of measuring instruments and measurement in all the fields of research, technical and economic activities in the range of Law about metrology. The institute provides services in all basic fields of metrology:
• fundamental metrology - maintenance and development of national standards, research and development in metrology,
• transfer of units - calibration of standards and measuring instruments,
• legal metrology - type approvals of legal metrology instruments, initial and subsequent verification of measuring instruments, metrological supervision, conformity assessment in metrology.
Since 1998, the Department of Nanometrology has focused on the development of scanning probe microscopy metrology and related methods. This includes providing traceability for scanning probe microscopy methods (metrology SPM), developing methods for quantitative analysis of different physical quantities with nanometre resolution and numerical analysis. The main effort of the Department is equally distributed between scientific projects, instrumentation development and publication activities.
METROLOGY SCANNING PROBE MICROSCOPE
HYBRID SCANNING PROBE MICROSCOPE
BRUKER DIMENSION ICON
Petr Klapetek is head of Department of Nanometrology. He is working in the field of quantitative scanning probe microscopy (SPM) since 1999, including atomic force microscopy (AFM), scanning near-field optical microscopy (SNOM), scanning thermal microscopy (SThM) and other similar methods. He is one of the founders of open source software initiative for SPM data analysis Gwyddion (http://gwyddion.net) and the author of open source FDTD solver Gsvit (http://gsvit.net). He designed and constructed several specialized metrology systems for scanning probe microscopy (e.g. national standard for nanometrology) and is an author of >70 publications in the field of SPM, mechanical and optical measurements.
Miroslav Valtr received Ph.D. in physics in 2010 from Masaryk University in Brno. He is a permanent member of staff at CMI since 2007. He is focused on SPM measurements and SPM data processing. He is also participating on instrumentation development and electronics design and administrates supercomputing facilities at CMI.